Product Description
Discover the unparalleled reliability and precision of the Two-Zone HAST Accelerated Aging Chamber. This cutting-edge instrument is designed for accelerated life reliability tests across a wide range of electronic components such as IC packaging, semiconductors, microelectronic chips, and magnetic materials.
🛡️ Space Efficiency
Benefit from a revolutionary dual-cell design that maximizes laboratory space efficiency. Lower operational costs while doubling your testing capabilities.
⚙️ Dual Control System
Experience the simplicity of a single-screen dual control system. Streamline complex settings and boost productivity with simultaneous testing.
📊 Custom Bias Terminals
Tailor your testing with optional bias terminals (4 to 128 options). The 96-channel bias terminal is crafted for rigorous chip bias testing.
🔄 Versatile Testing
Seamlessly integrates with both HAST unsaturated high-pressure steam tests and PCT saturated high-pressure steam tests.
📍Application Areas
This equipment excels in accelerated aging life testing for products including:
- PCBs and IC Semiconductors
- Connectors and Circuit Boards
- Magnetic and Polymer Materials
- EVA and Photovoltaic Modules
📜Test Standards Compliance
- AEC Q100-Rev-E (AEC Q101): Automotive-grade Semiconductor Discrete Device Stress Testing.
- JIS C0096-2001: Environmental Testing (Dumping, Damp Heat, Steady State).
- GB/T2423.40-1997: Constant Damp Heat in Unsaturated High-Pressure Steam.
- IEC60068-2-66-1994: Steady State Damp Heat assessments.
- JESD22 Series: Including A100, A101C, A102 (High-Pressure Boiling), A108, A110E (HAST), and A118B (UHAST).
Frequently Asked Questions
1. What is the primary purpose of a Two-Zone HAST Chamber?
It is used for highly accelerated stress testing (HAST) to evaluate the reliability and moisture resistance of electronic components like semiconductors and ICs by subjecting them to high pressure, temperature, and humidity.
2. Can this equipment perform both HAST and PCT tests?
Yes, this product is designed to seamlessly integrate both HAST (Unsaturated High-Pressure Steam) and PCT (Saturated High-Pressure Steam) testing protocols.
3. What are the advantages of the dual-cell design?
The dual-cell design allows for simultaneous testing of different samples or conditions within a single footprint, effectively doubling testing capacity while saving valuable laboratory floor space.
4. What materials are used for the internal chamber construction?
The inner box is constructed from high-grade SUS #316 stainless steel, ensuring excellent corrosion resistance and durability under extreme pressure and moisture conditions.
5. Does the chamber support bias testing for chips?
Yes, it features optional bias terminals ranging from 4 to 128 options, including a specialized 96-channel bias terminal specifically designed for rigorous chip bias testing requirements.
6. What safety features are included in the door design?
The chamber features an automatic door with intuitive push-button controls and integrated pressure protection to ensure operator safety during high-pressure testing cycles.
Winwon Chips
