Advanced Climatic Chamber for Reliable Aging Test Solutions

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Advanced Climatic Chamber for Reliable Aging Test Solutions

Customization:	Available
After-sales Service:	Video Intallment
Power Supply:	220-380V

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Product Description

Basic Specifications

Model NO.

WBE-2HAST-40

Certification

CE, TUV, ISO

Warranty

2 Years

Temperature Range

100°C to 156°C

Temperature Uniformity

<+/-0.5°C

Humidity Range

65%-100%Rh

Production Capacity

500set/Month

Package Size

700.00cm * 1000.00cm * 1900.00cm

Product Description

Introducing the Two-Zone HAST Accelerated Aging Chamber: a cutting-edge solution for accelerated life reliability testing. This state-of-the-art chamber is engineered to efficiently test a wide array of electronic components, including IC packaging, semiconductors, microelectronic chips, and magnetic materials. Operating under extreme conditions of high pressure, elevated temperatures, and both unsaturated and saturated damp heat environments, this chamber is the epitome of precision and reliability.

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Ingeniously designed with a dual-cell configuration, this chamber maximizes laboratory space utilization. The investment in one machine delivers the value equivalent to two.

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Featuring an intuitive single-screen dual control system, it simplifies complex settings and enables simultaneous testing of diverse samples.

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Flexibility of optional bias terminals (4 to 128), including a sophisticated 96-channel design specifically for chip bias testing.

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Versatile performance: adept at conducting HAST unsaturated high-pressure steam tests and PCT saturated evaluations.

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Safety and convenience: automatic door with push-button controls and built-in pressure protection.

Application Areas:
Ideal for accelerated aging life testing in industries including PCB, IC semiconductors, connectors, circuit boards, magnetic materials, polymer materials, EVA, and photovoltaic modules.

Test Standards Compliance:
AEC Q100-Rev-E (AEC Q101), JIS C0096-2001, GB/T2423.40-1997, IEC60068-2-66-1994, JESD22-A100, JESD22-A101C, JESD22-A102, JESD22-A108, JESD22-A110E, JESD22-A118B.

Technical Specifications

Model		WBE-HAST-30	WBE-HAST-40	WBE-HAST-55	WBE-HAST-65
Volume (L)		20 L	60 L	140 L	225 L
Inner Box Size (mm)	Diameter	300	400	550	650
Inner Box Size (mm)	Deep	450	550	650	750
Outer Box Size (mm)	Width	650	750	900	1000
	Deep	900	1050	1200	1300
	High	1750	1900	2100	2300
Temperature Range		A: +100~ +143ºC; B: +100~ +156ºC
Humidity Range		60%~100%R.h
Pressure Range		A: 0.2~3kg/cm²; B: 0.2~4kg/cm²
Material (Inner)		SUS #316 Stainless Steel

Frequently Asked Questions

1. What is the primary purpose of a Two-Zone HAST Chamber?

It is designed for Highly Accelerated Stress Testing (HAST) to evaluate the reliability of non-hermetic packaged solid-state devices in humid environments.

2. What are the advantages of the dual-cell configuration?

The dual-cell design allows for simultaneous testing of different samples under different conditions, effectively doubling the testing capacity while saving laboratory floor space.

3. Can the chamber handle both saturated and unsaturated steam tests?

Yes, this equipment is versatile enough to conduct HAST unsaturated high-pressure steam constant damp heat tests as well as PCT saturated high-pressure steam evaluations.

4. What safety features are integrated into the system?

The chamber includes an automatic door with push-button controls and built-in pressure protection systems to ensure operator safety during high-pressure cycles.

5. Does the chamber support bias testing for semiconductor chips?

Yes, it offers optional bias terminals ranging from 4 to 128 channels, including a specialized 96-channel design to meet rigorous chip bias testing requirements.

6. What materials are used for the chamber construction?

The inner box is constructed from high-grade SUS #316 stainless steel for corrosion resistance, while the outer box uses cold-rolled steel with an electrostatic spraying process.